SJ 20236-1993.Verification regulation of the model GH 2050/51 calibrator for transistor characteristic tracer.1范围1.1主题内容SJ 20236规程规定了GH 2050/51型半导体管特...
SJ 20237-1993.Verification regulation of model GH3123 IC automatic tester.1范围1.1主题内容SJ 20237规程规定了GH3123型集成电路自动测试仪的检定条件、检定项目...
SJ 20235-1993.Verification regulation of model IC-1500 automatic tester.1范围1.1主题内容SJ 20235规程规定了IC- 1500型自动测试仪的检定条件检定项目、检定方法...
SJ 20233-1993.Verification regulation of model IMPACT-I semiconductor discrete device test system.1范围1.1主题内容SJ 20233规程规定了IMPACT- I型半导体分立器件测试系...
SJ 20232-1993.Verification regulation of KDK double gate FET Gp tester.1范围1.1主题内容SJ 20232规程规定了国洋双栅场效应晶体管Gp参数测试仪的检定条件、检...
SJ 20242-1993.Verification regulation of model CC - 10 large capacitance measuring instruments.1范围1.1主题内容SJ 20242规程规定了CC- 10型大电容测试仪的检定条件、...
SJ 20241-1993.Verification regulation of YG series coil number tester.1范围1.1主题内容SJ 20241规程规定了YG系列匝数仪的检定条件检定项目、检定方法、检定...
SJ 20240-1993.Verification regulation of model HP4284A LCR precise measurement instruments.1范围1.1主题内容SJ 20240规程规定了HP4284A 型精密LCR测试仪(以下简称HP4...
SJ 20239-1993.Verification regulation of model CO-14 precise decade capacitance box.1范围1.1主题内容SJ 20239规程规定了CO-14型精密十进位电容箱的检定条件检定项...
SJ 20238-1993.Verification regulation of model ZX-68、ZX-73 high resistance box.1范围1.1主题内容SJ 20238规程规定了ZX-68型、ZX-73型精密高阻箱的检定，条件、检...
